jorge@pandora:~> sudo /usr/sbin/smartctl -a /dev/sda
smartctl version 5.37 [i686-suse-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HD501LJ
Serial Number: S0MUJFWQ222023
Firmware Version: CR100-12
User Capacity: 500,107,862,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Not recognized. Minor revision code: 0x52
Local Time is: Wed Jun 11 12:18:39 2008 CEST
==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever been run.
Total time to complete Offline data collection: (9033) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 154) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 47
3 Spin_Up_Time 0x0007 100 100 015 Pre-fail Always - 7168
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 16
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 1768
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 14
13 Read_Soft_Error_Rate 0x000e 100 100 000 Old_age Always - 404157721
187 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 0
188 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 0
190 Temperature_Celsius 0x0022 062 060 000 Old_age Always - 38
194 Temperature_Celsius 0x0022 124 118 000 Old_age Always - 38
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 404157721
196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0
201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
202 TA_Increase_Count 0x0032 253 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 3 hours (0 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 80 bf b8 05 e0 Error: ICRC, ABRT 128 sectors at LBA = 0x0005b8bf = 374975
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 80 bf b8 05 e0 00 02:15:14.125 READ DMA
c8 00 80 3f b8 05 e0 00 02:15:14.125 READ DMA
c8 00 80 bf b4 05 e0 00 02:15:14.125 READ DMA
c8 00 80 3f b4 05 e0 00 02:15:14.125 READ DMA
c8 00 80 bf ac 05 e0 00 02:15:14.125 READ DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
jorge@pandora:~> sudo /usr/sbin/smartctl -a /dev/sdb
smartctl version 5.37 [i686-suse-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HD501LJ
Serial Number: S0MUJFWQ222017
Firmware Version: CR100-12
User Capacity: 500,107,862,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Not recognized. Minor revision code: 0x52
Local Time is: Wed Jun 11 12:19:06 2008 CEST
==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever been run.
Total time to complete Offline data collection: (8996) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 153) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 3067
3 Spin_Up_Time 0x0007 100 100 015 Pre-fail Always - 7296
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 16
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 1768
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 083 083 000 Old_age Always - 12969
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 14
13 Read_Soft_Error_Rate 0x000e 100 100 000 Old_age Always - 399570840
187 Unknown_Attribute 0x0032 075 075 000 Old_age Always - 13893658
188 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 3
190 Temperature_Celsius 0x0022 068 063 000 Old_age Always - 32
194 Temperature_Celsius 0x0022 142 127 000 Old_age Always - 32
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 399570840
196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 097 097 000 Old_age Always - 30
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0
201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 31
202 TA_Increase_Count 0x0032 253 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 26 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 26 occurred at disk power-on lifetime: 1740 hours (72 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 20 e8 35 e7 e5 Error: UNC 32 sectors at LBA = 0x05e735e8 = 99038696
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 20 e8 35 e7 e5 00 21d+08:58:45.079 READ DMA
ec 00 00 00 00 00 a0 00 21d+08:58:37.079 IDENTIFY DEVICE
ef 03 45 00 00 00 a0 00 21d+08:58:37.079 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 a0 00 21d+08:58:37.079 IDENTIFY DEVICE
Error 25 occurred at disk power-on lifetime: 1740 hours (72 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 20 e8 35 e7 e5 Error: UNC 32 sectors at LBA = 0x05e735e8 = 99038696
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 20 e8 35 e7 e5 00 21d+08:58:36.954 READ DMA
ec 00 00 00 00 00 a0 00 21d+08:58:32.142 IDENTIFY DEVICE
ef 03 45 00 00 00 a0 00 21d+08:58:32.142 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 a0 00 21d+08:58:32.142 IDENTIFY DEVICE
Error 24 occurred at disk power-on lifetime: 1740 hours (72 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 20 e8 35 e7 e5 Error: UNC 32 sectors at LBA = 0x05e735e8 = 99038696
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 20 e8 35 e7 e5 00 21d+08:58:32.017 READ DMA
c8 00 20 08 35 e7 e5 00 21d+08:58:26.079 READ DMA
c8 00 20 30 15 e4 e5 00 21d+08:58:26.017 READ DMA
c8 00 20 d0 12 e4 e5 00 21d+08:58:26.017 READ DMA
c8 00 20 90 0d e4 e5 00 21d+08:58:26.017 READ DMA
Error 23 occurred at disk power-on lifetime: 1740 hours (72 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 20 80 60 c4 e5 Error: UNC 32 sectors at LBA = 0x05c46080 = 96755840
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 20 80 60 c4 e5 00 21d+08:51:42.767 READ DMA
c8 00 08 f8 5f c4 e5 00 21d+08:51:38.204 READ DMA
ca 00 20 60 5b 18 ea 00 21d+08:51:38.204 WRITE DMA
c8 00 18 e0 5f c4 e5 00 21d+08:51:38.204 READ DMA
c8 00 20 00 5f c4 e5 00 21d+08:51:38.079 READ DMA
Error 22 occurred at disk power-on lifetime: 1740 hours (72 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 90 35 e7 e5 Error: UNC 8 sectors at LBA = 0x05e73590 = 99038608
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 90 35 e7 e5 00 21d+08:37:40.267 READ DMA
c8 00 08 88 35 e7 e5 00 21d+08:37:33.204 READ DMA
ca 00 08 bf 09 95 e0 00 21d+08:37:33.204 WRITE DMA
c8 00 20 30 d4 e8 e5 00 21d+08:37:33.204 READ DMA
c8 00 20 98 79 e8 e5 00 21d+08:37:33.204 READ DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
jorge@pandora:~>
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